Tynax ~ Patent Library

Patent for Sale:

Private Listing: Number 6371 Private  

Confidential: Information on this listing is available under NDA to qualifying buyers.


The owner of this listing has requested that patent numbers, descriptions and other information be provided only to qualifying buyers under confidentiality agreement.

Please review the patent class information to determine if the patent(s) matching your areas of interest.
For more information, click "Tell Me More" and we will be happy to follow up with you.

Patent Summary

U.S. Patent Classes & Classifications Covered in this listing:

Class 385: Optical Waveguides

(1) An optical waveguiding element, which conveys light from one point to another through an optically transparent elongated structure by modal transmission, total internal reflection, or total reflectorization. (2) A combination of an optical waveguiding element with an additional broadly recited optical element which couples light or a combination. (3) A combination of an optical waveguiding element with structure which mechanically joins this waveguiding element with another or with a diverse optical element. (4) An optical modulator where the modulation of a light wave characteristic is performed exclusively within an optical waveguiding element. (5) Other miscellaneous devices formed of an optical waveguide (e.g., a waveguide sensing device) and supplemental devices which are limited to use with an optical waveguide (e.g., an external clamp or retainer).

Subclass 39: Particular coupling structure
Subclass 50: Waveguide to waveguide

Class 850: Scanning-probe techniques or apparatus; applications of scanning-probe techniques, e.g., scanning probe microscopy [spm]

This class covers Scanning probes, i.e., devices having at least a tip of nanometre sized dimensions that scans or moves over an object surface, typically at a distance of a few angstroms or nanometres, monitoring some interaction between the tip and the surface, e.g., monitoring the generation of a tunnelling current and techniques or apparatus involving the use of scanning probes. The following subjects are therefore covered, the list being non-exhaustive: scanning probes, per se, their manufacture or their related instrumentation, e.g., holders; scanning probe microscopy (SPM) or microscopes, i.e., the application of scanning probes to the investigation or analysis of a surface structure in atomic ranges; applications, other than SPM, involving the use of scanning probes.

Subclass 37: AC mode (EPO)
Subclass 38: Tapping mode (EPO)