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Patent Summary

U.S. Patent Classes & Classifications Covered in this listing:

Class 250: Radiant Energy

This class provides for all methods and apparatus for using, generating, controlling or detecting radiant energy, combinations including such methods or apparatus, subcombinations of same and accessories therefore not classifiable elsewhere.

Subclass 205: Controlling light source intensity
Subclass 208.1: Plural photosensitive image detecting element arrays
Subclass 214R: Special photocell or electron tube circuits
Subclass 214C: Compensation
Subclass 214SW: Electronic switch

Class 348: Television

Generating, processing, transmitting or transiently displaying a sequence of images, either locally or remotely, in which the local light variations composing the images may change with time.

Subclass 252: With transition or edge sharpening (e.g., aperture correction)
Subclass 294: Solid-state image sensor
Subclass 308: Including switching transistor and photocell at each pixel site (e.g., MOS-type image sensor)
Subclass E3.021: For disturbance correction or prevention within the image-sensor, e.g., biasing, blooming, smearing (EPO)
Subclass E5.081: Correction or equalization of amplitude response, e.g., dark current, blemishes, non-uniformity (EPO)
Subclass E5.09: Transforming infra-red radiation (EPO)
Subclass E5.091: Using electrically scanned solid-state devices (EPO)

Class 324: Electricity: Measuring And Testing

This is the residual home for all subject matter, not elsewhere classified, relating to the measuring, testing (or sensing) of electric properties, (e.g., determining ground resistivity, determining frequency of an alternating current, determining kilowatt hour demand), or the measuring, testing or sensing of nonelectric properties by electric means (e.g., determining moisture, a nonelectric property, by measuring conductance with a resistance bridge; determining speed, a nonelectric property by use of an electric tachometer).

Subclass 207.26: Approach or retreat
Subclass 225: With compensation for test variable
Subclass 232: Plural magnetic fields in material
Subclass 233: With phase sensitive element
Subclass 235: Noncoil type
Subclass 243: Plural sensors
Subclass 247: Nonparallel plural magnetic sensors
Subclass 306: Determine fluid flow rate
Subclass 307: Using a nuclear resonance spectrometer system
Subclass 309: To obtain localized resonance within a sample
Subclass 329: Using movable transmitter and receiver

Class 340: Communications: Electrical

Communications - the handling of information or intelligence, restricted to the conveying of said information or intelligence between geographically spaced points. Information or intelligence is defined as being, matter which is handled by signaling systems or signaling devices (such as telegraph systems) or by that portion of nonsignaling systems or nonsignaling devices (such as power supply systems) which is designated in the arts as having a control function (such as the supervisory circuits which control the circuit breakers of an electric power network). Handling, as used above, is defined as being the active coaction between the tangible communication system or device and the intangible information or intelligence, and such coaction may assume various forms, such as transmission, storage, exhibiting, etc.

Subclass 551: Disturbance of magnetic field
Subclass 686.1: Position responsive
Subclass 686.6: Proximity or distance

Class 600: Surgery

Subclass 410: Magnetic resonance imaging or spectroscopy
Subclass 550: Detecting foreign object or calculus by probing

Class 382: Image Analysis

This is the generic class for apparatus and corresponding methods for the automated analysis of an image or recognition of a pattern. Included herein are systems that transform an image for the purpose of (a) enhancing its visual quality prior to recognition, (b) locating and registering the image relative to a sensor or stored prototype, or reducing the amount of image data by discarding irrelevant data, and (c) measuring significant characteristics of the image.

Subclass 131: Tomography (e.g., CAT scanner)
Subclass 211: With electrically controlled light modulator or filter
Subclass 275: Artifact removal or suppression (e.g., distortion correction)

Class 378: X-Ray Or Gamma Ray Systems Or Devices

This is the generic class for apparatus and corresponding processes involving the generation or use of electromagnetic radiation within the X-ray spectrum. Methods, systems, and elements with specific features characteristic of X-ray applications are classified here.

Subclass 21: Tomography

Class 257: Active Solid-State Devices (E.G., Transistors, Solid-State Diodes)

This class provides for active solid-state electronic devices, that is, electronic devices or components that are made up primarily of solid materials, usually semiconductors, which operate by the movement of charge carriers - electrons or holes - which undergo energy level changes within the material and can modify an input voltage to achieve rectification, amplification, or switching action, and are not classified elsewhere.

Subclass 292: Photodiodes accessed by FETs

Class 359: Optical: Systems And Elements

Optical elements included in this class are: Lenses; Polarizers; Diffraction gratings; Prisms; Reflectors; Filters; Projection screens; Optical Modulators; Optical Demodulators. Among the optical systems included in this class are: Compound lens systems; Light reflecting signalling systems (e.g., retroreflectors); stereoscopic systems; Binocular devices; Systems of lenticular elements; Systems involving light interference; Glare reducing systems; Light dividing and combining systems; Light control systems (e.g., light valves); building illumination with natural light; Systems for protecting or shielding elements; Optical systems whose operation depends upon polarizing, diffracting, dispersing, reflecting, or refracting light; kaleidoscopes. Further included are certain apertures, closures, and viewing devices of a specialized nature which involve no intentional reflection, refraction, or filtering of light rays. This class also includes optical elements combined with another type of structure(s) to constitute an optical element combined with a nonoptical structure or a perfection or improvement in the optical element.

Subclass 629: By partial reflection at beam splitting or combining surface