Tynax ~ Patent Library

Patent for Sale:

EDA and Integrated Circuit Design    

EDA design methods, simulation and test of integrated circuits.


This Portfolio is forward referenced by the following companies: LSI Corporation, Praesagus, Inc., Cadence Design Systems, Inc., Intel Corporation, International Business Machines Corporation, STMicroelectronics, Inc., Rambus Inc., Agilent Technologies, Inc., Xilinx, Inc., Advanced Micro Devices, Inc., Synopsys, Inc., Texas Instruments Incorporated, Sun Microsystems, Inc., Integrated Device Technology, Inc., Broadcom etc.

An exemplary patent generally relates to a method of designing integrated circuits in which the susceptibility of
the integrated circuit to noise is estimated by analyzing the components of the circuits. Suspected noise susceptibility factors were investigated to determine the effects of various potential factors on noise characteristics.

The seller would like to be granted a license back.

The seller may consider selling these patents individually.

Patent Summary

U.S. Patent Classes & Classifications Covered in this listing:

Class 716: Data Processing: Design And Analysis Of Circuit Or Semiconductor Mask

This class provides for electrical data processing apparatus and corresponding methods for the following subject matter: for sketching, designing, and analyzing circuit components; for planning, designing, analyzing, and devising a template used for etching circuit pattern on semiconductor wafers.

Class 702: Data Processing:Measuring, Calibrating, Or Testing

This class provides for apparatus and corresponding methods wherein the data processing system or calculating computer is designed for or utilized in an environment relating to a specific or generic measurement system, a calibration or correction system, or a testing system.

Subclass 119: Including program initialization (e.g., program loading) or code selection (e.g., program creation)
Subclass 179: Statistical measurement
Subclass 181: Probability determination
Subclass 182: Performance or efficiency evaluation
Subclass 183: Diagnostic analysis

Class 703: Data Processing:Structural Design, Modeling, Simulation, And Emulation

This class provides for electrical data processing apparatus and corresponding methods for the following processes or apparatus: 1. for sketching or outlining of layout of a physical object or part. 2. for representing a physical process or system by mathematical expression. 3. for modeling a physical system which includes devices for performing arithmetic and some limited logic operation upon an electrical signal, such as current or voltage, which is a continuously varying representation of physical quantity. 4. for modeling to reproduce a nonelectrical device or system to predict its performance or to obtain a desired performance. 5. for modeling and reproducing an electronic device or electrical system to predict its performance or to obtain a desired performance. 6. that allows the data processing system to interpret and execute programs written for another kind of data processing system.

Subclass 14: Circuit simulation
Subclass 17: Event-driven

Class 711: Electrical Computers And Digital Processing Systems: Memory

This class provides, within an electrical computer or digital data processing system, for the following processes and apparatus 1. for addressing memory wherein the processes and apparatus involve significant address manipulating (e.g., combining, translating, or mapping and other techniques for formatting and modifying address data) and are combined with specific memory configurations or memory systems; 2. for accessing and controlling memory (e.g., transferring and modifying address data, selecting storage devices, scheduling access); and 3. for forming memory addresses (e.g., virtual memory addressing, address translating, translation-lookaside buffers (TLBs), boundary checking, and page mode).

Subclass 3: Addressing cache memories
Subclass 117: Hierarchical memories
Subclass 170: Memory configuring
Subclass 210: Resolving conflict, coherency, or synonym problem
Subclass 220: Combining two or more values to create address

Class 714: Error Detection/Correction And Fault Detection/Recovery

This class provides for process or apparatus for detecting and correcting errors in electrical pulse or pulse coded data; it also provides for process or apparatus for detecting and recovering from faults in electrical computers and digital data processing systems, as well as logic level based systems.

Subclass 36: Test sequence at power-up or initialization

Class 717: Data Processing: Software Development, Installation, And Management

This class provides for software program development tool and techniques including processes and apparatus for controlling data processing operations pertaining to the development, maintenance, and installation of software programs. Such processes and apparatus include: processes and apparatus for program development functions such as specification, design, generation, and version management of source code programs; processes and apparatus for debugging of computer program including monitoring, simulation, emulation, and profiling of software programs; processes and apparatus for translating or compiling programs from a high-level representation to an intermediate code representation and finally into an object or machine code representation, including linking, and optimizing the program for subsequent execution; processes and apparatus for updating, installing, and version management of developed code.

Subclass 136: Translation of code
Subclass 150: Loop compiling
Subclass 151: Optimization