Patent for Sale:

Fiscal Conversion of Film Thickness Statistical Index: Cpk    

All industries that measure Film Thickness as a parameter may fiscally convert, benchmark and forecast its manufacturing performance and product quality by measuring one statistical index: Cpk.

Overview

Features
Patents convert statistical index into economic forecasting tool.
- Fiscal Conversion of Film Thickness Cpk's.
- Benchmark & Forecast Coatings' Film Thickness Fiscal Performance
- Industry Proven
- Statistical Index links Qualitative, Process, Material, and Financial Data
- Technology available in in Stand Alone Software Module
- 31 Claims

Analytical Tool for Evaluating
- New Coating Formulations - Example: High Solids, Powder
- New Processes - Example: Wet on Wet, 3 Layer Wet
- Capital Investments - Example: Booth Environment Controls
- Coating Applicators - Example: Robotics
- Production Lines - Example: Line 1, Line 2

Benefits
- Identifies Optimal Film Thickness Performance
- Optimize Coating Usage
- Forecasts Optimal Film Thickness Performance
- Decrease Material Costs
- Variability Reduction
- Increase Throughput

Primary Application of the Technology

-Coatings Market
Annual Market Identified $15.6 Billion

Patented Technology Benefits
-Technology qualitatively and fiscally substantiates coatings performance

Other Potential Applications
-Software Providers
Enterprise Resource Planning, Data Collection, Statistical Process Control
Annual Market Identified $29.8 Billion

Patented Technology Benefits
-Technology justifies software license based on identified and forecasted savings


-Robotics Market
Annual Market Identified $844 Million

Patented Technology Benefits
-Technology qualitatively and fiscally substantiates robotics performance
-Justifies robotic purchases on identified and forecasted savings


-Lean Manufacturing/Six Sigma Services/Quality Management Consulting
Annual Market Identified $444 Million

Patented Technology Benefits
-Technology justifies consultant study on identified and forecasted savings


-Inspection Gauges Manufacturers
Annual Market Identified $108 Million

Patented Technology Benefits
-Technology incorporated within gauge justifies purchases on identified savings

The Problem Solved by the Technology

Patented technology converts statistical index associated with film thickness into economic benchmarking and forecasting tool.

How the Technology Solves the Problem

SPC charts and data pertaining to film thickness automatically converted into fiscal balance sheets.

Competitive Advantage

Worldwide, manufacturing and service organizations have incorporated either Total Quality Management, Lean or Six Sigma strategies within their operations. Objective is to qualitatively improve financials while reducing costs.

The statistical index, Cpk, is ubiquitous in industry.

The Cpk index in itself is used as a standard criteria, within Six Sigma and Quality Circles.

The fiscal conversion of this index is a breakthrough technology.

It converts factory floor data and/or service data into a fiscal balance sheet.

Quality performance levels immediately correlated with costs.

Comments on Deal Structure, Potential Terms and Restrictions

Patents and know-how available for sale.
Patents subject to previous “covenant not to sue agreement” that define current and future markets.

The seller may consider selling these patents individually.

Additional Information

Technology has been bundled as part of a commercial software package that is use within one automaker paint facilities throughout the Americas.

Documented benefits achieved at one automaker facility:
-Throughput Rate Increase 11%
-Resultant Prime Coat Cpk Value 1.65
-Annualized Savings $750,000
Material/Labor

Applicable to those firms seeking technology in the following areas:
1) Industrial and Factory Information Management Patents
2) Technology Innovations in Production Quality and Safety

Patent Summary

U.S. Patent Classes & Classifications Covered in this listing:

Class 702: Data Processing:Measuring, Calibrating, Or Testing

This class provides for apparatus and corresponding methods wherein the data processing system or calculating computer is designed for or utilized in an environment relating to a specific or generic measurement system, a calibration or correction system, or a testing system.

Subclass 170: Thickness or width
Subclass 97: Length, distance, or thickness

Class 324: Electricity: Measuring And Testing

This is the residual home for all subject matter, not elsewhere classified, relating to the measuring, testing (or sensing) of electric properties, (e.g., determining ground resistivity, determining frequency of an alternating current, determining kilowatt hour demand), or the measuring, testing or sensing of nonelectric properties by electric means (e.g., determining moisture, a nonelectric property, by measuring conductance with a resistance bridge; determining speed, a nonelectric property by use of an electric tachometer).

Subclass 230: Layer or layered material

Class 700: Data Processing: Generic Control Systems Or Specific Applications

This class is structured into two main divisions: (1)for the combination of a data processing or calculating computer apparatus (or corresponding methods for performing data processing or calculating operations) AND a device or apparatus controlled thereby, the entirety hereinafter referred to as a "control system". (2)for data processing or calculating computer apparatus (or corresponding methods for performing data processing or calculating operations) wherein the data processing or calculating computer apparatus is designed for or utilized in a particular art device, system, process, or environment, or is utilized for the solution of a particular problem in a field other than mathematics (arithmetic processing per se is classified elsewhere).

Subclass 90: SPECIFIC APPLICATION, APPARATUS OR PROCESS

Class 73: Measuring And Testing

Processes and apparatus for making a measurement of any kind or for making a test of any kind, and takes all such subject matter not provided for in other classes. The term "test" includes inspection, processes and apparatus for determining qualities by inspection being included where not provided for in other classes. This class is the generic class for sampling and takes all sampling apparatus and processes not otherwise provided.

Subclass 597: Velocity or propagation time measurement
Subclass 598: For flaw or discontinuity detection