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Private Listing: Number 3338 Private  

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Patent Summary

U.S. Patent Classes & Classifications Covered in this listing:

Class 438: Semiconductor Device Manufacturing: Process

This class provides for manufacturing a semiconductor containing a solid-state device for the following purposes: (a) conducting or modifying an electrical current, (b) storing electrical energy for subsequent discharge within a microelectronic integrated circuit, or (c) converting electromagnetic wave energy to electrical energy or electrical energy to electromagnetic energy. Also operations involving: (1) coating a substrate with a semiconductive material, or (2) coating a semiconductive substrate or substrate containing a semiconductive region. It also provides for operations involving etching a semiconductive substrate or etching a substrate containing a semiconductive region. The class provides for packaging or treatment of packaged semiconductor.

Subclass 425: Combined with formation of recessed oxide by localized oxidation
Subclass 459: Thinning of semiconductor substrate
Subclass 52: Having cantilever element
Subclass 733: Using or orientation dependent etchant (i.e., anisotropic etchant)
Subclass 734: Sequential etching steps on a single layer
Subclass 739: Lateral etching of intermediate layer (i.e., undercutting)
Subclass 928: FRONT AND REAR SURFACE PROCESSING
Subclass 977: THINNING OR REMOVAL OF SUBSTRATE

Class 850: Scanning-probe techniques or apparatus; applications of scanning-probe techniques, e.g., scanning probe microscopy [spm]

This class covers Scanning probes, i.e., devices having at least a tip of nanometre sized dimensions that scans or moves over an object surface, typically at a distance of a few angstroms or nanometres, monitoring some interaction between the tip and the surface, e.g., monitoring the generation of a tunnelling current and techniques or apparatus involving the use of scanning probes. The following subjects are therefore covered, the list being non-exhaustive: scanning probes, per se, their manufacture or their related instrumentation, e.g., holders; scanning probe microscopy (SPM) or microscopes, i.e., the application of scanning probes to the investigation or analysis of a surface structure in atomic ranges; applications, other than SPM, involving the use of scanning probes.

Subclass 26: Scanning Tunnelling Microscopy [STM] or apparatus therefor, e.g., STM probes (EPO)
Subclass 33: Atomic Force Microscopy [AFM] or apparatus therefor, e.g., AFM probes(EPO)
Subclass 40: Probes, their manufacture, or their related instrumentation, e.g., holders (EPO)
Subclass 53: Probe holders (EPO)
Subclass 55: Probe tip arrays (EPO)
Subclass 59: Particular materials (EPO)
Subclass 62: APPLICATIONS OF SCANNING-PROBE TECHNIQUES OTHER THAN SPM (EPO)
Subclass 63: SCANNING-PROBE TECHNIQUES OR APPARATUS NOT OTHERWISE PROVIDED FOR (EPO)

Class G9B/9.001:


Class G9B/9.003:


Class G9B/9.009:


Class 365: Static Information Storage And Retrieval

Apparatus or corresponding processes for the static storage and retrieval of information. For classification herein, the storage system must be (1) static, (2) a singular storage element or plural elements of the same type, (3) addressable.

Subclass 118: Electron beam
Subclass 151: Molecular or atomic
Subclass 163: Amorphous (electrical)
Subclass 164: Electrical contacts
Subclass 171: Magnetic thin film
Subclass 174: Semiconductive
Subclass 206: Noise suppression
Subclass 211: Temperature compensation
Subclass 34: Amorphous

Class 977: Nanotechnology

This art collection provides for disclosures related to: nanostructure and chemical compositions of nanostructure; device that include at least one nanostructure; mathematical algorithms, e.g., computer software, etc., specifically adapted for modeling configurations or properties of nanostructure; methods or apparatus for making, detecting, analyzing, or treating nanostructure; and specified particular uses of nanostructure. the term "nanostructure" is defined to mean an atomic, molecular, or macromolecular structure that: has at least one physical dimension of approximately 1-100 nanometers; and possesses a special property, provides a special function, or produces a special effect that is uniquely attributable to the structure s nanoscale physical size.

Subclass 760: Superlattice with graded effective bandgap (e.g., CHIRP-graded superlattice, etc.)
Subclass 873: Tip holder
Subclass 874: Probe tip array
Subclass 878: Shape/taper
Subclass 879: Material

Class G9B/9.002:


Class G9B/9.007:


Class 428: Stock Material Or Miscellaneous Articles

This is the residual class for: 1. Stock material in the form of a structurally defined web, sheet, rod, strand, fiber, filament, cell, flake, particle not provided elsewhere. 2. Stock material in the form of a web, sheet, mass or layer which consists of or contains a structurally defined constituent or element. 3. A nonstructural laminate defined merely in terms of the composition of one or more layers. 4. An article of manufacture or an intermediate-article not provided for elsewhere. 5. A process for applying an impregnating material to a naturally solid product such as a wood beam, a sheet of leather or a stone, or for applying a coating to a base, and which process includes no significant method step.

Subclass 212: Including components having same physical characteristic in differing degree
Subclass 408: SELF-SUSTAINING CARBON MASS OR LAYER WITH IMPREGNANT OR OTHER LAYER
Subclass 469: Next to metal salt or oxide
Subclass 472: Refractory metal salt or oxide
Subclass 64.1: CIRCULAR SHEET OR CIRCULAR BLANK
Subclass 64.5: Tellurium containing
Subclass 64.6: Protective layer
Subclass 698: Carbide-, nitride-, or sulfide-containing layer
Subclass 699: Next to second metal-compound-containing layer

Class 369: Dynamic Information Storage Or Retrieval

Apparatus for the storage or retrieval of arbitrarily variable information which is retained in a storage medium by variation of a physical characteristic. The information is stored or retrieved by causing or sensing a variation of a physical characteristic of the storage medium by a transducer having relative motion along a continuous path.

Subclass 100: Radiation beam modification of or by storage medium
Subclass 101: Invisible radiation (e.g., electron beam or X-ray)
Subclass 126: Electrical modification or sensing of storage medium (e.g., capacitive, resistive, electrostatic charge)
Subclass 127: Mechanical modification or sensing of storage medium
Subclass 213: Additional motion of storage element support to effect tracking
Subclass 258.1: Specific detail of storage medium support or motion production
Subclass 47.1: CONTROL OF STORAGE OR RETRIEVAL OPERATION BY A CONTROL SIGNAL TO BE RECORDED OR REPRODUCED

Class 205: Electrolysis: Processes, Compositions Used Therein, And Methods Of Preparing The Compositions

Processes (1) involving the use of electrolysis (2) of preparing or purifying compounds or elements involving chemical reaction brought about by electrical or wave energy in a magnetic field; (3) of treating materials involving chemical reaction brought about by wave energy; (4) of preparing or purifying compounds or elements involving chemical reaction brought about by an electrostatic field or electrical discharge; (5) involving the use of electrophoresis or electro-osmosis; (6) of treating a liquid (a) to separate or purify the liquid using electric and magnetic fields simultaneously, (b) to separate or purify the liquid using an electric field, or (c) using a magnetic field to obtain some effect other than mere separation or purification of the liquid; (7) involving coating, forming, or etching by the use of sputtering; and (8) involving coating by the use of vacuum arc discharge. Electrolyte compositions specialized for use in electrolytic processes or methods of preparing the compositions.

Subclass 306: Utilizing inorganic cyanide-containing bath

Class G9B/9.005:


Class 310: Electrical Generator Or Motor Structure

This is the residual class for all subject matter, not elsewhere classified, relating to electrical generator or motor structure.

Subclass 309: Electrostatic

Class 318: Electricity: Motive Power Systems

This is the generic class for system of electrical supply and/or of control for one or more electric motors where the electric motor is claimed in combination with such systems of supply and/or control and the electric motor as claimed constitutes the ultimate and sole electrical load device supplied by the system or constitutes the ultimate and sole electrical device being controlled.

Subclass 116: NONMAGNETIC MOTOR

Class G9B/19:


Class G9B/19.027:


Class G9B/33.042:


Class 430: Radiation Imagery Chemistry: Process, Composition, Or Product Thereof

This is the generic class for: (1) Forming the likeness of an object, or an instrumented or discernible phenomenon, in a chemically defined receiver or in a receiver wherein radiation produces a chemical reaction, by use of radiation. (2) Finishing an image by chemical processing regardless how formed. (3) A radiation sensitive receiver, composition, or product disclosed solely for radiation imagery chemistry, and process of making same. (4) A nonradiation sensitive-receiver, composition, or product. (5) An imaged product by a process or employing a receiver, composition, or product.

Subclass 270.13: Which changes phase during recording

Class G9B/7.194:


Class 324: Electricity: Measuring And Testing

This is the residual home for all subject matter, not elsewhere classified, relating to the measuring, testing (or sensing) of electric properties, (e.g., determining ground resistivity, determining frequency of an alternating current, determining kilowatt hour demand), or the measuring, testing or sensing of nonelectric properties by electric means (e.g., determining moisture, a nonelectric property, by measuring conductance with a resistance bridge; determining speed, a nonelectric property by use of an electric tachometer).

Subclass 661: With variable distance between capacitor electrodes
Subclass 676: With pulse signal processing circuit
Subclass 681: With frequency signal response, change or processing circuit

Class 711: Electrical Computers And Digital Processing Systems: Memory

This class provides, within an electrical computer or digital data processing system, for the following processes and apparatus 1. for addressing memory wherein the processes and apparatus involve significant address manipulating (e.g., combining, translating, or mapping and other techniques for formatting and modifying address data) and are combined with specific memory configurations or memory systems; 2. for accessing and controlling memory (e.g., transferring and modifying address data, selecting storage devices, scheduling access); and 3. for forming memory addresses (e.g., virtual memory addressing, address translating, translation-lookaside buffers (TLBs), boundary checking, and page mode).

Subclass 100: STORAGE ACCESSING AND CONTROL
Subclass 101: Specific memory composition
Subclass 114: Arrayed (e.g., RAIDs)
Subclass 165: Internal relocation
Subclass 168: Concurrent accessing

Class 361: Electricity: Electrical Systems And Devices

Systems or devices which provide safety and protection for other systems and devices; control circuits for electromagnetic devices and non-electromagnetic-type relays. Systems or devices which discharge, or prevent the accumulation of electrical charge on or in an object or material; circuits for charging objects or materials. Systems for generating or conducting an electric charge. Systems which process electrical speed signals. Circuits for reversing the polarity of an electric circuit. Systems which cause the ignition of a fuel or an explosive charge. Systems and processes for demagnetizing a magnetic field. Transformers and inductors with integral switch, capacitor or lock. Electrostatic capacitors, per se. Housings and mounting assemblies with plural diverse electrical components. Electrolytic systems and devices.

Subclass 760: Connection of components to board

Class 714: Error Detection/Correction And Fault Detection/Recovery

This class provides for process or apparatus for detecting and correcting errors in electrical pulse or pulse coded data; it also provides for process or apparatus for detecting and recovering from faults in electrical computers and digital data processing systems, as well as logic level based systems.


Class G9B/9.025:


Class 257: Active Solid-State Devices (E.G., Transistors, Solid-State Diodes)

This class provides for active solid-state electronic devices, that is, electronic devices or components that are made up primarily of solid materials, usually semiconductors, which operate by the movement of charge carriers - electrons or holes - which undergo energy level changes within the material and can modify an input voltage to achieve rectification, amplification, or switching action, and are not classified elsewhere.

Subclass 415: Physical deformation
Subclass 420: Means to reduce sensitivity to physical deformation
Subclass E29.324: Controllable by variation of applied mechanical force (e.g., of pressure) (EPO)

Class 250: Radiant Energy

This class provides for all methods and apparatus for using, generating, controlling or detecting radiant energy, combinations including such methods or apparatus, subcombinations of same and accessories therefore not classifiable elsewhere.

Subclass 306: INSPECTION OF SOLIDS OR LIQUIDS BY CHARGED PARTICLES
Subclass 307: Methods

Class G9B/11.004:


Class G9B/9.008:


Class G9B/9.011:


Class G9B/9.013:


Class G9B/5.193:


Class 216: Etching A Substrate: Processes

Chemical etching processes for treating articles of commerce or intermediate articles not otherwise provided for in which one of the manufacturing steps includes a chemical etching step (use of an etchant) and wherein the material treated is not completely removed.

Subclass 11: FORMING OR TREATING AN ARTICLE WHOSE FINAL CONFIGURATION HAS A PROJECTION
Subclass 41: MASKING OF A SUBSTRATE USING MATERIAL RESISTANT TO AN ETCHANT (I.E., ETCH RESIST)
Subclass 74: Etching inorganic substrate
Subclass 79: Etching silicon containing substrate

Class 450: Foundation Garments

This class includes devices which are specifically designed to fit the human body to protect, compress, support, restrain or alter the configuration of the body torso or a portion thereo.

Subclass 5: Midriff extension includes overlapping relatively movable parts

Class G9B/9.006:


Class G9B/9.014:


Class G9B/11.059:


Class G9B/11.001:


Class G9B/9.022:


Class 702: Data Processing:Measuring, Calibrating, Or Testing

This class provides for apparatus and corresponding methods wherein the data processing system or calculating computer is designed for or utilized in an environment relating to a specific or generic measurement system, a calibration or correction system, or a testing system.

Subclass 65: Including related electrical parameter