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Patent for Sale:

Diffraction Analysis and Diffractometer    

A new x-ray diffractometer for analysis of material.


The x-ray diffractometer is an electromagnetic waves analyzer, with a wavelength ten times smaller than a millionth of millimetre. The small size of the waves is right to analyze the quality of crystallite lattices, that compose all the known materials, from those with an excellent crystalline goodness (crystals, minerals, gemmas) to those with medium or low crystalline features. Between these two extremes are included metals, ceramics, polymers, proteins, and even glass and all type of materials that can be characterized by an aggregation of atoms. DIF-ROB has the structural ambition to satisfy these conditions. It can be identified as a wrist containing all the essential elements to realize measures and through automatic controls can advance the object. Unlike the lab diffractometers, the measuring device is removable from the rigid support of the X-ray generator.

Primary Application of the Technology

Superficial analysis for a large number of different materials (typical penetrations are from few nanometers to several hundreds of microns). Almost all the condensed materials and all those presenting crystalline status and aggregation. Several sectors are covered : Aeronautics, Automotive, Energy, Cultural Heritage - and many others

The Problem Solved by the Technology

On site diffraction material surface analysis.

How the Technology Solves the Problem

The general configuration of the goniometer is the theta-theta type, where the source and the detector move in different directions. The instrument can be considered as an industrial robot, in which the main arm, meter, include the following equipments:
- a double Eulero’s cradle that support the diffractometric device, giving diffraction measures. The main Eulero’s cradle contains the source, detector, where it can be installed different optical devices for applications with parallel or divergent beam . The main Eulero’s cradle has a ray of about 20 cm. The collimation of the incident and diffracted beam can be optimized to minimize the radiation dispersion in the system.
- A movable device with three translational grades of freedom and one rotation grade of freedom. The system is equipped with 8 stepping motors that give all movements for the fine positioning and the control of the diffractometer performances.
- Pointing devices and optical detectors (small laser and a color camera), with a software of control that help the positioning and the measure. The remote control is based on programmable micro-processors that activate even the movements of the 8 step motors.

Competitive Advantage

The patented diffractometer is portable. Working prototypes are available for tests.

The seller may consider selling these patents individually.

Patent Summary

U.S. Patent Classes & Classifications Covered in this listing:

Class 378: X-Ray Or Gamma Ray Systems Or Devices

This is the generic class for apparatus and corresponding processes involving the generation or use of electromagnetic radiation within the X-ray spectrum. Methods, systems, and elements with specific features characteristic of X-ray applications are classified here.

Subclass 71: Diffractometry
Subclass 72: Stress analysis
Subclass 73: Crystalography

Class 250: Radiant Energy

This class provides for all methods and apparatus for using, generating, controlling or detecting radiant energy, combinations including such methods or apparatus, subcombinations of same and accessories therefore not classifiable elsewhere.

Subclass 390.09: Using diffractometers

European Patent Classes & Classifications Covered in this listing:


INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES . Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays neutrons .

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