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- 1 Issued Patent - EP
- 1 Patent Application - AU
- 1 Patent Application - CN
- 1 Patent Application - JP
- 1 Issued Patent - AT
- 1 Issued Patent - RU
Patent for Sale:Diffraction Analysis and Diffractometer
Primary Application of the Technology
The Problem Solved by the Technology
How the Technology Solves the Problem
- a double Eulero’s cradle that support the diffractometric device, giving diffraction measures. The main Eulero’s cradle contains the source, detector, where it can be installed different optical devices for applications with parallel or divergent beam . The main Eulero’s cradle has a ray of about 20 cm. The collimation of the incident and diffracted beam can be optimized to minimize the radiation dispersion in the system.
- A movable device with three translational grades of freedom and one rotation grade of freedom. The system is equipped with 8 stepping motors that give all movements for the fine positioning and the control of the diffractometer performances.
- Pointing devices and optical detectors (small laser and a color camera), with a software of control that help the positioning and the measure. The remote control is based on programmable micro-processors that activate even the movements of the 8 step motors.
The seller may consider selling these patents individually.
Class 378: X-Ray Or Gamma Ray Systems Or Devices
This is the generic class for apparatus and corresponding processes involving the generation or use of electromagnetic radiation within the X-ray spectrum. Methods, systems, and elements with specific features characteristic of X-ray applications are classified here.Subclass 71: Diffractometry
Subclass 72: Stress analysis
Subclass 73: Crystalography
Class 250: Radiant Energy
This class provides for all methods and apparatus for using, generating, controlling or detecting radiant energy, combinations including such methods or apparatus, subcombinations of same and accessories therefore not classifiable elsewhere.Subclass 305: ELECTRON ENERGY ANALYSIS
Subclass 306: INSPECTION OF SOLIDS OR LIQUIDS BY CHARGED PARTICLES
Subclass 390.09: Using diffractometers
Class G01N23: PHYSICS - MEASURING
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES . Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays neutrons .