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Private Listing: Number 2928 Private  

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Patent Summary

U.S. Patent Classes & Classifications Covered in this listing:

Class 438: Semiconductor Device Manufacturing: Process

This class provides for manufacturing a semiconductor containing a solid-state device for the following purposes: (a) conducting or modifying an electrical current, (b) storing electrical energy for subsequent discharge within a microelectronic integrated circuit, or (c) converting electromagnetic wave energy to electrical energy or electrical energy to electromagnetic energy. Also operations involving: (1) coating a substrate with a semiconductive material, or (2) coating a semiconductive substrate or substrate containing a semiconductive region. It also provides for operations involving etching a semiconductive substrate or etching a substrate containing a semiconductive region. The class provides for packaging or treatment of packaged semiconductor.

Subclass 102: HAVING SELENIUM OR TELLURIUM ELEMENTAL SEMICONDUCTOR COMPONENT
Subclass 424: Grooved and refilled with deposited dielectric material
Subclass 455: BONDING OF PLURAL SEMICONDUCTOR SUBSTRATES
Subclass 456: Having enclosed cavity
Subclass 459: Thinning of semiconductor substrate
Subclass 50: Physical stress responsive
Subclass 52: Having cantilever element
Subclass 54: Thermally responsive
Subclass 667: Conductive feedthrough or through-hole in substrate
Subclass 758: COATING OF SUBSTRATE CONTAINING SEMICONDUCTOR REGION OR OF SEMICONDUCTOR SUBSTRATE
Subclass 780: Depositing organic material (e.g., polymer, etc.)
Subclass 782: With substrate handling during coating (e.g., immersion, spinning, etc.)
Subclass 787: Silicon oxide formation

Class 257: Active Solid-State Devices (E.G., Transistors, Solid-State Diodes)

This class provides for active solid-state electronic devices, that is, electronic devices or components that are made up primarily of solid materials, usually semiconductors, which operate by the movement of charge carriers - electrons or holes - which undergo energy level changes within the material and can modify an input voltage to achieve rectification, amplification, or switching action, and are not classified elsewhere.

Subclass 397: In vertical-walled groove
Subclass 415: Physical deformation
Subclass 417: Strain sensors
Subclass 420: Means to reduce sensitivity to physical deformation
Subclass 422: With magnetic field directing means (e.g., shield, pole piece, etc.)
Subclass 467: Temperature
Subclass 499: INTEGRATED CIRCUIT STRUCTURE WITH ELECTRICALLY ISOLATED COMPONENTS
Subclass 506: Including dielectric isolation means
Subclass 508: With metallic conductor within isolating dielectric or between semiconductor and isolating dielectric (e.g., metal shield layer or internal connection layer)
Subclass 510: Dielectric in groove
Subclass 521: Sides of grooves along major crystal planes (e.g., (111), (100) planes, etc.)
Subclass E21.001: PROCESSES OR APPARATUS ADAPTED FOR MANUFACTURE OR TREATMENT OF SEMICONDUCTOR OR SOLID-STATE DEVICES OR OF PARTS THEREOF (EPO)
Subclass E21.122: Bonding of semiconductor wafer to insulating substrate or to semic onducting substrate using an intermediate insulating layer (EPO)
Subclass E21.567: Using bonding technique (EPO)
Subclass E21.597: Formed through semiconductor substrate (EPO)
Subclass E21.705: Assembly of devices consisting of solid-state components formed in or on a common substrate; assembly of integrated circuit devices (EPO)
Subclass E23.011: Internal lead connections, e.g., via connections, feedthrough structures (EPO)
Subclass E25.013: Stacked arrangements of devices (EPO)
Subclass E29.324: Controllable by variation of applied mechanical force (e.g., of pressure) (EPO)
Subclass E31.086: Device sensitive to very short wavelength (e.g., X-ray, gamma-ray, or corpuscular radiation) (EPO)

Class 310: Electrical Generator Or Motor Structure

This is the residual class for all subject matter, not elsewhere classified, relating to electrical generator or motor structure.

Subclass 309: Electrostatic

Class 318: Electricity: Motive Power Systems

This is the generic class for system of electrical supply and/or of control for one or more electric motors where the electric motor is claimed in combination with such systems of supply and/or control and the electric motor as claimed constitutes the ultimate and sole electrical load device supplied by the system or constitutes the ultimate and sole electrical device being controlled.

Subclass 116: NONMAGNETIC MOTOR

Class 360: Dynamic Magnetic Information Storage Or Retrieval

This class is an integral part of Class 369, Dynamic Information Storage or Retrieval, and is the specific class for apparatus and corresponding processes for the storage and retrieval of information based on relative movement between a magnetic record carrier and a transducer. It includes apparatus and corresponding processes for making copies or editing of records falling within the above definition. A magnetic record carrier within the meaning of this class is an element which consists of a magnetizable material or is comprised of a coating or impregnation of magnetizable material which is intended for the storage of more than a single bit of information.

Subclass 121: Plural gaps
Subclass 294.4: Piezoelectric adjuster
Subclass 78.05: Coarse and fine head drive motors
Subclass 78.12: Including particular head actuator
Subclass 88: RECORD TRANSPORT WITH HEAD STATIONARY DURING TRANSDUCING
Subclass 99.09: Movable drive

Class 702: Data Processing:Measuring, Calibrating, Or Testing

This class provides for apparatus and corresponding methods wherein the data processing system or calculating computer is designed for or utilized in an environment relating to a specific or generic measurement system, a calibration or correction system, or a testing system.

Subclass 129: Quantitative determination by weight
Subclass 34: Wear or deterioration evaluation

Class 365: Static Information Storage And Retrieval

Apparatus or corresponding processes for the static storage and retrieval of information. For classification herein, the storage system must be (1) static, (2) a singular storage element or plural elements of the same type, (3) addressable.

Subclass 118: Electron beam

Class 369: Dynamic Information Storage Or Retrieval

Apparatus for the storage or retrieval of arbitrarily variable information which is retained in a storage medium by variation of a physical characteristic. The information is stored or retrieved by causing or sensing a variation of a physical characteristic of the storage medium by a transducer having relative motion along a continuous path.

Subclass 101: Invisible radiation (e.g., electron beam or X-ray)
Subclass 126: Electrical modification or sensing of storage medium (e.g., capacitive, resistive, electrostatic charge)
Subclass 13.14: Magnetic field generation
Subclass 258.1: Specific detail of storage medium support or motion production
Subclass 270.1: Disc holding or locating (e.g., spindle structure)
Subclass 44.16: Flat flexible support (e.g., parallel leaf spring, etc.)

Class 720: Dynamic Optical Information Storage Or Retrieval

This is the specific class for apparatus and corresponding processes for the storage and retrieval of variable optical or magneto-optical information based on relative movement between an optical storage carrier or medium and a transducer along a continuous path. It includes apparatus and corresponding processes for making copies or editing of optical records falling within the above definition, and also includes the record carrier or medium, per se, having particular information storage structure.

Subclass 718: OPTICAL STORAGE MEDIUM STRUCTURE

Class G9B/9.001:


Class G9B/9.002:


Class G9B/9.003:


Class G9B/9.025:


Class 850: Scanning-probe techniques or apparatus; applications of scanning-probe techniques, e.g., scanning probe microscopy [spm]

This class covers Scanning probes, i.e., devices having at least a tip of nanometre sized dimensions that scans or moves over an object surface, typically at a distance of a few angstroms or nanometres, monitoring some interaction between the tip and the surface, e.g., monitoring the generation of a tunnelling current and techniques or apparatus involving the use of scanning probes. The following subjects are therefore covered, the list being non-exhaustive: scanning probes, per se, their manufacture or their related instrumentation, e.g., holders; scanning probe microscopy (SPM) or microscopes, i.e., the application of scanning probes to the investigation or analysis of a surface structure in atomic ranges; applications, other than SPM, involving the use of scanning probes.

Subclass 1: SCANNING OR POSITIONING ARRANGEMENTS, I.E., ARRANGEMENTS FOR ACTIVELY CONTROLLING THE MOVEMENT OR POSITION OF THE PROBE (EPO)
Subclass 55: Probe tip arrays (EPO)
Subclass 9: Non-SPM analyzing devices, e.g., Scanning Electron Microscope [SEM], spectrometer or optical microscope (EPO)

Class 977: Nanotechnology

This art collection provides for disclosures related to: nanostructure and chemical compositions of nanostructure; device that include at least one nanostructure; mathematical algorithms, e.g., computer software, etc., specifically adapted for modeling configurations or properties of nanostructure; methods or apparatus for making, detecting, analyzing, or treating nanostructure; and specified particular uses of nanostructure. the term "nanostructure" is defined to mean an atomic, molecular, or macromolecular structure that: has at least one physical dimension of approximately 1-100 nanometers; and possesses a special property, provides a special function, or produces a special effect that is uniquely attributable to the structure s nanoscale physical size.

Subclass 840: MANUFACTURE, TREATMENT, OR DETECTION OF NANOSTRUCTURE
Subclass 849: With scanning probe
Subclass 861: Scanning tunneling probe
Subclass 863: Atomic force probe
Subclass 873: Tip holder
Subclass 874: Probe tip array
Subclass 881: Microscopy or spectroscopy (e.g., SEM, TEM, etc.)

Class G9B/23:


Class G9B/9.004:


Class G9B/9.006:


Class G9B/9.007:


Class 73: Measuring And Testing

Processes and apparatus for making a measurement of any kind or for making a test of any kind, and takes all such subject matter not provided for in other classes. The term "test" includes inspection, processes and apparatus for determining qualities by inspection being included where not provided for in other classes. This class is the generic class for sampling and takes all sampling apparatus and processes not otherwise provided.

Subclass 105: Roughness
Subclass 655: With light beam indicator

Class 29: Metal Working

Metal working or shaping - it comprises processes, tools, machines, and apparatus not classifiable in the specific classes relating to the manufacture of articles from metal. It has been made the generic class for the following regardless of the composition of the blank, stock material, or article recited or worked upon: (a) process of electric condenser making; (b) a burnishing process; (c) a process of manufacture; (d) apparatus used to assemble or disassemble.

Subclass 602.1: Electromagnet, transformer or inductor
Subclass 825: Conductor or circuit manufacturing
Subclass 836: Different components

Class 307: Electrical Transmission Or Interconnection Systems

This is the residual class for all subject matter, not elsewhere classified, relating to electrical transmission or interconnection systems.

Subclass 149: MISCELLANEOUS SYSTEMS

Class 313: Electric Lamp And Discharge Devices

This is the generic class for electric lamp and electric space discharge device structure. Examples of such devices are electric incandescent lamps, gas or vapor filled electric discharge tubes, including lamps, mercury arc devices, vacuum discharge tubes, radio tubes, cyclotrons, cathode-ray tubes, photosensitive discharge devices, secondary emission electron multipliers, spark plugs, and open air arc and spark devices.

Subclass 360.1: Plural apertured electrodes

Class 331: Oscillators

This is the generic class for electrical oscillators.

Subclass 36C: Capacitor controlled AFC
Subclass 67: WITH ELECTROMAGNETIC OR ELECTROSTATIC SHIELD

Class 361: Electricity: Electrical Systems And Devices

Systems or devices which provide safety and protection for other systems and devices; control circuits for electromagnetic devices and non-electromagnetic-type relays. Systems or devices which discharge, or prevent the accumulation of electrical charge on or in an object or material; circuits for charging objects or materials. Systems for generating or conducting an electric charge. Systems which process electrical speed signals. Circuits for reversing the polarity of an electric circuit. Systems which cause the ignition of a fuel or an explosive charge. Systems and processes for demagnetizing a magnetic field. Transformers and inductors with integral switch, capacitor or lock. Electrostatic capacitors, per se. Housings and mounting assemblies with plural diverse electrical components. Electrolytic systems and devices.

Subclass 255: Including spark electrode make-break

Class G9B/5.004:


Class G9B/5.044:


Class G9B/5.135:


Class G9B/11.007:


Class G9B/11.057:


Class 250: Radiant Energy

This class provides for all methods and apparatus for using, generating, controlling or detecting radiant energy, combinations including such methods or apparatus, subcombinations of same and accessories therefore not classifiable elsewhere.

Subclass 306: INSPECTION OF SOLIDS OR LIQUIDS BY CHARGED PARTICLES
Subclass 307: Methods
Subclass 309: Positive ion probe or microscope type
Subclass 370.01: Semiconductor system
Subclass 370.02: Alpha particle detection system
Subclass 370.14: Particular detection structure (e.g., MOS, PIN)

Class G9B/9.008:


Class G9B/9.016:


Class G9B/9.01:


Class 359: Optical: Systems And Elements

Optical elements included in this class are: Lenses; Polarizers; Diffraction gratings; Prisms; Reflectors; Filters; Projection screens; Optical Modulators; Optical Demodulators. Among the optical systems included in this class are: Compound lens systems; Light reflecting signalling systems (e.g., retroreflectors); stereoscopic systems; Binocular devices; Systems of lenticular elements; Systems involving light interference; Glare reducing systems; Light dividing and combining systems; Light control systems (e.g., light valves); building illumination with natural light; Systems for protecting or shielding elements; Optical systems whose operation depends upon polarizing, diffracting, dispersing, reflecting, or refracting light; kaleidoscopes. Further included are certain apertures, closures, and viewing devices of a specialized nature which involve no intentional reflection, refraction, or filtering of light rays. This class also includes optical elements combined with another type of structure(s) to constitute an optical element combined with a nonoptical structure or a perfection or improvement in the optical element.

Subclass 245: Electro-optic
Subclass 247: Using reflective or cavity structure
Subclass 263: By reflection
Subclass 290: By changing physical characteristics (e.g., shape, size or contours) of an optical element
Subclass 302: Using reflecting or cavity structure

Class G9B/9.011: