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Private Listing: Number 2754 Private  

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Patent Summary

U.S. Patent Classes & Classifications Covered in this listing:

Class 600: Surgery

Subclass 111: Sterioscopic
Subclass 166: Stereoscopic
Subclass 176: Having particular distal lens or window
Subclass 341: Inserted in body
Subclass 342: Light conducting fiber inserted in body
Subclass 564: Cutting

Class 606: Surgery


Class 356: Optics: Measuring And Testing

Methods and apparatus (1) for analyzing light to measure or test its characteristics, such as intensity, color and polarization; (2) for determining the optical or nonoptical properties of materials or articles by noting, as by inspection, measurement, or test the effect produced by the materials or articles on light associated therewith; and (3) for measuring the dimensions of structures or the spatial relationships such as distances or angle bearings of spaced points by comparison of the respective properties (usually direction or spatial position) of the light from these points or by comparison of the properties of these lights with some scale or standard. The light analyzing includes or is for spectroscopy, interference, polarization, beam direction or pattern, focal position of a light source, shade or color, and photometers. The material or article properties determined are or involve crystal or gem examination, material strain analysis, blood analysis, optical pyrometers, egg candling, cutting blade sharpness, oil testing, document verification, flatness, lens or reflector testing, refraction testing, monitoring moving webs or fabrics, light transmission or absorption, light reflection, inspection for flaws or imperfections in materials, and thread counting. The dimensioning and spatial relationship determination includes triangulation by a light beam, contour plotting, range or height finders, motion stopping, velocity or velocity/height measuring, sighting where the optical element or reticle moves with the sighted object, particle size determination, particle light scattering, electrophoresis, angle measuring or axial alignment, mensuration or configuration comparison, alignment in a lateral direction, and fiducial instruments.

Subclass 337: BY PARTICLE LIGHT SCATTERING
Subclass 338: With photocell detection
Subclass 364: BY POLARIZED LIGHT EXAMINATION
Subclass 369: Of surface reflection
Subclass 39: BLOOD ANALYSIS
Subclass 484: Having light beams of different frequencies (e.g., heterodyning)
Subclass 600: SURFACE ROUGHNESS

Class 422: Chemical Apparatus And Process Disinfecting, Deodorizing, Preserving, Or Sterilizing

This is a generic class for (1) processes of disinfecting, deodorizing, preserving or sterilizing and (2) apparatus for (a) carrying out chemical reactions, (b) preparing or treating chemical compounds or compositions even though only a physical reaction is discernible, (c) performing an analysis which involves either a chemical reaction or a physical reaction not elsewhere provided, for and (d) carrying out the above processes not elsewhere provided for.

Subclass 102: Container
Subclass 82.05: Measuring optical property by using ultraviolet, infrared, or visible light
Subclass 99: Miscellaneous laboratory apparatus and elements, per se

Class 83: Cutting

Methods and machines for penetrating material, without substantial reshaping flow of such material, by means of (1) a solid tool, or fluid current, either of which applies mechanical deforming force to the material by direct physical contact therewith, the fluid current forcing the material against a solid tool whose edge defines the line of cut; (2) a heated solid tool which directly engages the material (to effect penetration thereof by melting, or by transmission of mechanical energy, or both); or (3) opposed, controlled fluid currents.

Subclass 167: WITH RECEPTACLE OR SUPPORT FOR CUT PRODUCT

Class 250: Radiant Energy

This class provides for all methods and apparatus for using, generating, controlling or detecting radiant energy, combinations including such methods or apparatus, subcombinations of same and accessories therefore not classifiable elsewhere.

Subclass 339.12: Using sample absorption for chemical composition analysis
Subclass 227.27: With coherent interferrometric light

Class 378: X-Ray Or Gamma Ray Systems Or Devices

This is the generic class for apparatus and corresponding processes involving the generation or use of electromagnetic radiation within the X-ray spectrum. Methods, systems, and elements with specific features characteristic of X-ray applications are classified here.

Subclass 119: SOURCE
Subclass 120: Nuclear excited

Class 257: Active Solid-State Devices (E.G., Transistors, Solid-State Diodes)

This class provides for active solid-state electronic devices, that is, electronic devices or components that are made up primarily of solid materials, usually semiconductors, which operate by the movement of charge carriers - electrons or holes - which undergo energy level changes within the material and can modify an input voltage to achieve rectification, amplification, or switching action, and are not classified elsewhere.

Subclass 30: Tunneling through region of reduced conductivity

Class 359: Optical: Systems And Elements

Optical elements included in this class are: Lenses; Polarizers; Diffraction gratings; Prisms; Reflectors; Filters; Projection screens; Optical Modulators; Optical Demodulators. Among the optical systems included in this class are: Compound lens systems; Light reflecting signalling systems (e.g., retroreflectors); stereoscopic systems; Binocular devices; Systems of lenticular elements; Systems involving light interference; Glare reducing systems; Light dividing and combining systems; Light control systems (e.g., light valves); building illumination with natural light; Systems for protecting or shielding elements; Optical systems whose operation depends upon polarizing, diffracting, dispersing, reflecting, or refracting light; kaleidoscopes. Further included are certain apertures, closures, and viewing devices of a specialized nature which involve no intentional reflection, refraction, or filtering of light rays. This class also includes optical elements combined with another type of structure(s) to constitute an optical element combined with a nonoptical structure or a perfection or improvement in the optical element.

Subclass 435: Repetitious lens structure
Subclass 717: Having two components
Subclass 718: Having one component
Subclass 793: Two components

Class 351: Optics: Eye Examining, Vision Testing And Correcting

Optometry - includes eye examining and vision testing instruments. These instruments must include some optical structure or they must operate in conjunction with the optical or vision path of the eye. Included also are these instruments combined with eye exercising and/or training devices; certain accessories such as test charts and/or targets which may involve projection, illuminators and supports which are peculiar to these instruments. Plus methods of operating or using these instruments. Also included are spectacles and eyeglasses, which may include the frames or mountings, with fitted opthalmic lenses, spectacles combined with holders for microphotographs, telescopes or face protecting masks, antiglare or light absorption, rear view reflectors, decorations moisture prevention or absorption, and supports or holders, temples, bridges, connectors, lens linings or rims, and nose pads or cushions, perfecting features in lenses such as with light filtering or with protecting layers. Lastly, methods of making the spectacles and eyeglasses, the opthalmic lenses, and lens repair devices.

Subclass 205: Objective type
Subclass 206: Including eye photography
Subclass 221: Including illuminator
Subclass 246: Methods of use

Class 382: Image Analysis

This is the generic class for apparatus and corresponding methods for the automated analysis of an image or recognition of a pattern. Included herein are systems that transform an image for the purpose of (a) enhancing its visual quality prior to recognition, (b) locating and registering the image relative to a sensor or stored prototype, or reducing the amount of image data by discarding irrelevant data, and (c) measuring significant characteristics of the image.

Subclass 154: 3-D or stereo imaging analysis
Subclass 243: Shape, icon, or feature-based compression
Subclass 255: Focus measuring or adjusting (e.g., deblurring)