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Patent Summary

U.S. Patent Classes & Classifications Covered in this listing:

Class 430: Radiation Imagery Chemistry: Process, Composition, Or Product Thereof

This is the generic class for: (1) Forming the likeness of an object, or an instrumented or discernible phenomenon, in a chemically defined receiver or in a receiver wherein radiation produces a chemical reaction, by use of radiation. (2) Finishing an image by chemical processing regardless how formed. (3) A radiation sensitive receiver, composition, or product disclosed solely for radiation imagery chemistry, and process of making same. (4) A nonradiation sensitive-receiver, composition, or product. (5) An imaged product by a process or employing a receiver, composition, or product.

Subclass 252: Image layer portion transfer and element therefor
Subclass 258: Forming nonplanar image
Subclass 314: Etching of substrate and material deposition
Subclass 315: Material deposition only
Subclass 317: Insulative or nonmetallic dielectric etched
Subclass 325: Post image treatment to produce elevated pattern
Subclass 326: Pattern elevated in radiation unexposed areas
Subclass 328: Post imaging radiant energy exposure
Subclass 329: Removal of imaged layers

Class 438: Semiconductor Device Manufacturing: Process

This class provides for manufacturing a semiconductor containing a solid-state device for the following purposes: (a) conducting or modifying an electrical current, (b) storing electrical energy for subsequent discharge within a microelectronic integrated circuit, or (c) converting electromagnetic wave energy to electrical energy or electrical energy to electromagnetic energy. Also operations involving: (1) coating a substrate with a semiconductive material, or (2) coating a semiconductive substrate or substrate containing a semiconductive region. It also provides for operations involving etching a semiconductive substrate or etching a substrate containing a semiconductive region. The class provides for packaging or treatment of packaged semiconductor.

Subclass 108: Flip-chip-type assembly
Subclass 127: Encapsulating
Subclass 167: Having Schottky gate (e.g., MESFET, HEMT, etc.)
Subclass 172: Having heterojunction (e.g., HEMT, MODFET, etc.)
Subclass 574: T-shaped electrode
Subclass 579: T-shaped electrode
Subclass 624: Separating insulating layer is laminate or composite of plural insulating materials
Subclass 631: Having planarization step
Subclass 655: Silicide
Subclass 662: Utilizing laser
Subclass 664: Forming silicide
Subclass 699: Plural coating steps
Subclass 951: Lift-off

Class 257: Active Solid-State Devices (E.G., Transistors, Solid-State Diodes)

This class provides for active solid-state electronic devices, that is, electronic devices or components that are made up primarily of solid materials, usually semiconductors, which operate by the movement of charge carriers - electrons or holes - which undergo energy level changes within the material and can modify an input voltage to achieve rectification, amplification, or switching action, and are not classified elsewhere.

Subclass 778: Flip chip
Subclass E29.156: Including silicide layer contacting silicon layer (EPO)
Subclass E23.16: Additional layers associated with aluminum layers, e.g., adhesion, barrier, cladding layers (EPO)
Subclass E21.173: Deposition of Schottky electrode (EPO)
Subclass E21.245: Removal by chemical etching, e.g., dry etching (EPO)
Subclass E21.347: Using electromagnetic radiation, e.g., laser radiation (EPO)
Subclass E21.407: With an heterojunction interface channel or gate, e.g., HFET, HIGFET, SI SFET, HJFET, HEMT (EPO)
Subclass E21.438: Using self-aligned silicidation, i.e., salicide (EPO)
Subclass E21.452: Lateral single-gate transistors (EPO)
Subclass E21.503: Encapsulation of active face of flip chip device, e.g., under filling or under encapsulation of flip-chip, encapsulation perform on chip or mounting substrate (EPO)
Subclass E21.58: Planarizing dielectric (EPO)
Subclass E21.582: Characterized by formation and post treatment of conductors, e.g., patterning (EPO)

Class 73: Measuring And Testing

Processes and apparatus for making a measurement of any kind or for making a test of any kind, and takes all such subject matter not provided for in other classes. The term "test" includes inspection, processes and apparatus for determining qualities by inspection being included where not provided for in other classes. This class is the generic class for sampling and takes all sampling apparatus and processes not otherwise provided.

Subclass 821: To fracture, crushing, or yield point
Subclass 827: Bond test
Subclass 150A: Bond strength

Class 332: Modulators

A modulator combined with structure for measuring or indicating some aspect of the modulation process or characteristic of the modulated signal is classified here. Specifically, measurement or indication of a frequency or amplitude modulator A specific modulating signal source (e.g., microphone or photocell). A combination including both a modulator and a demodulator is classified.

Subclass 128: Modulating signal applied to plural elements of the loop

Class 331: Oscillators

This is the generic class for electrical oscillators.

Subclass 2: Plural oscillators controlled
Subclass 23: Sensing modulation (e.g., frequency modulation controlled oscillator

Class 455: Telecommunications

This is the generic class for modulated carrier wave communications not elsewhere classifiable.

Subclass 78: With transmitter-receiver switching or interaction prevention
Subclass 113: With frequency control
Subclass 119: Carrier frequency stabilization

Class 324: Electricity: Measuring And Testing

This is the residual home for all subject matter, not elsewhere classified, relating to the measuring, testing (or sensing) of electric properties, (e.g., determining ground resistivity, determining frequency of an alternating current, determining kilowatt hour demand), or the measuring, testing or sensing of nonelectric properties by electric means (e.g., determining moisture, a nonelectric property, by measuring conductance with a resistance bridge; determining speed, a nonelectric property by use of an electric tachometer).

Subclass 601: Calibration
Subclass 638: Scattering type parameters (e.g., complex reflection coefficient)

Class 359: Optical: Systems And Elements

Optical elements included in this class are: Lenses; Polarizers; Diffraction gratings; Prisms; Reflectors; Filters; Projection screens; Optical Modulators; Optical Demodulators. Among the optical systems included in this class are: Compound lens systems; Light reflecting signalling systems (e.g., retroreflectors); stereoscopic systems; Binocular devices; Systems of lenticular elements; Systems involving light interference; Glare reducing systems; Light dividing and combining systems; Light control systems (e.g., light valves); building illumination with natural light; Systems for protecting or shielding elements; Optical systems whose operation depends upon polarizing, diffracting, dispersing, reflecting, or refracting light; kaleidoscopes. Further included are certain apertures, closures, and viewing devices of a specialized nature which involve no intentional reflection, refraction, or filtering of light rays. This class also includes optical elements combined with another type of structure(s) to constitute an optical element combined with a nonoptical structure or a perfection or improvement in the optical element.

Subclass 359: Multilayer filter or multilayer reflector
Subclass 580: Produced by coating or lamina
Subclass 582: Layer having specified nonoptical property
Subclass 584: Reflector
Subclass 586: Layers having specified index of refraction

Class 428: Stock Material Or Miscellaneous Articles

This is the residual class for: 1. Stock material in the form of a structurally defined web, sheet, rod, strand, fiber, filament, cell, flake, particle not provided elsewhere. 2. Stock material in the form of a web, sheet, mass or layer which consists of or contains a structurally defined constituent or element. 3. A nonstructural laminate defined merely in terms of the composition of one or more layers. 4. An article of manufacture or an intermediate-article not provided for elsewhere. 5. A process for applying an impregnating material to a naturally solid product such as a wood beam, a sheet of leather or a stone, or for applying a coating to a base, and which process includes no significant method step.

Subclass 426: Of quartz or glass

Class 333: Wave Transmission Lines And Networks

Electric wave transmission systems wherein electromagnetic wave energy is guided or constrained by a wave transmission device of the long line type other than loaded lines. Included are passive wave transmission networks simulating the characteristics of a long line wave transmission systems or wave guides, such as artificial lines, delay networks, resonators, impedance matching networks, equalizers, wave filters and transmission line terminations. Passive coupling networks and terminating networks having either lumped or distributed electrical circuit parameters and having impedance characteristics. Smoothing type wave filters having shunt capacitance, or series inductance. Networks including a wave transmission device and means for decreasing the amplitude range of the signal applied to the transmission device as the signal increases in amplitude and means for increasing or restoring the amplitude range of the signal after the transmission over the transmission device. Passive networks for producing an output wave which is the time derivative or time integral of the input wave. Systems including active elements for producing across at least two of the system terminals a negative resistance, and/or an inductance, or capacitance which may be positive or negative. Wave traps using long line elements.

Subclass 101: Including switching means
Subclass 103: Having semiconductor operating means
Subclass 104: Using TEM lines

Class 714: Error Detection/Correction And Fault Detection/Recovery

This class provides for process or apparatus for detecting and correcting errors in electrical pulse or pulse coded data; it also provides for process or apparatus for detecting and recovering from faults in electrical computers and digital data processing systems, as well as logic level based systems.

Subclass 733: Built-in testing circuit (BILBO)
Subclass 734: Structural (in-circuit test)