Patent Portfolio for Sale:Private Listing: Number 1999
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Class 702: Data Processing:Measuring, Calibrating, Or TestingThis class provides for apparatus and corresponding methods wherein the data processing system or calculating computer is designed for or utilized in an environment relating to a specific or generic measurement system, a calibration or correction system, or a testing system.
Subclass 188: Remote supervisory monitoring
Class 700: Data Processing: Generic Control Systems Or Specific ApplicationsThis class is structured into two main divisions: (1)for the combination of a data processing or calculating computer apparatus (or corresponding methods for performing data processing or calculating operations) AND a device or apparatus controlled thereby, the entirety hereinafter referred to as a "control system". (2)for data processing or calculating computer apparatus (or corresponding methods for performing data processing or calculating operations) wherein the data processing or calculating computer apparatus is designed for or utilized in a particular art device, system, process, or environment, or is utilized for the solution of a particular problem in a field other than mathematics (arithmetic processing per se is classified elsewhere).
Subclass 219: Associating or disassociating plural articles
Class 378: X-Ray Or Gamma Ray Systems Or DevicesThis is the generic class for apparatus and corresponding processes involving the generation or use of electromagnetic radiation within the X-ray spectrum. Methods, systems, and elements with specific features characteristic of X-ray applications are classified here.
Subclass 54: Thickness or density analysis
Class G01T1: Physics - MeasuringMeasurement of nuclear or x-radiation. Measuring x-radiation, gamma radiation, corpuscular radiation, or cosmic radiation.
Class G01V5: Physics - MeasuringGeophysics; gravitational measurements; detecting masses or objects. Prospecting or detecting by the use of nuclear radiation, e.g. of natural or induced radioactivity.