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Atomic Force Microscopy    

Used to understand physical and chemical processes on material surfaces, such as catalysts, semiconductors, sensors and electronic devices, and allows the development of highly functional materials.

Overview

The technology allows a quantum beam aided atomic force microscopy that can concurrently carry out atomic-level configuration observation, elemental and chemical state analysis of the material surface with the use of an atomic force microscope. It can operate in liquids, and analyze biosamples at the atomic level.

Patent Summary

U.S. Patent Classes & Classifications Covered in this listing:

Class 250: Radiant Energy

This class provides for all methods and apparatus for using, generating, controlling or detecting radiant energy, combinations including such methods or apparatus, subcombinations of same and accessories therefore not classifiable elsewhere.

Subclass 306: INSPECTION OF SOLIDS OR LIQUIDS BY CHARGED PARTICLES

Class 73: Measuring And Testing

Processes and apparatus for making a measurement of any kind or for making a test of any kind, and takes all such subject matter not provided for in other classes. The term "test" includes inspection, processes and apparatus for determining qualities by inspection being included where not provided for in other classes. This class is the generic class for sampling and takes all sampling apparatus and processes not otherwise provided.

Subclass 105: Roughness

European Patent Classes & Classifications Covered in this listing:

Class G01Q60: PHYSICS - MEASURING

SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY Note In this subclass, the first place priority rule is applied, i.e. at each hierarchical level, classification is made in the first approp. .

Class G01N13: PHYSICS - MEASURING

INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES . Investigating surface or boundary effects, e.g. wetting power; Investigating diffusion effects; Analysing materials by determining surface, boundary, or diffusion effects; Investigating or analysing surface structures in atomic ranges .

Class G01Q30: PHYSICS - MEASURING

SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY Note In this subclass, the first place priority rule is applied, i.e. at each hierarchical level, classification is made in the first approp. .

Class Y01N8: GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS - BROAD TECHNICAL FIELDS CHARACTERISED BY DIMENSIONAL ASPECTS

NANOTECHNOLOGY . Nanotechnlogy for interacting, sensing or actuating .