Tynax ~ Patent Library

Patent for License:

Scanning Probe Microscope Device    

A delay time modulated and time resolved microscope device


The technology provides direct measurement of a probe signal component that is reliant on a delay time between ultrashort laser pulses and measurements unaffected by a fluctuation in the intensity of ultrashort laser pulses, and stops the probe apex from thermal expansion and shrinkage. It is therefore possible to measure a photoexcited physical phenomenon at a temporal resolution in the order of femtoseconds and at a spatial resolution in the order of angstroms. It can also directly measure a probe signal component that is reliant on a delay time between ultrashort laser pulses different in wavelength, that allows acquisition of knowledge of a higher order photoexcited physical phenomenon.

The technology is particularly helpful when employed for the elucidation of a photoexcited physical phenomenon which occurs in a local area of nanoscale, and in a time period in the order of femtoseconds.

Patent Summary

U.S. Patent Classes & Classifications Covered in this Patent:

Class 250: Radiant Energy

This class provides for all methods and apparatus for using, generating, controlling or detecting radiant energy, combinations including such methods or apparatus, subcombinations of same and accessories therefore not classifiable elsewhere.

Subclass 307: Methods
Subclass 423F: Field ionization type

Class 977: Nanotechnology

This art collection provides for disclosures related to: nanostructure and chemical compositions of nanostructure; device that include at least one nanostructure; mathematical algorithms, e.g., computer software, etc., specifically adapted for modeling configurations or properties of nanostructure; methods or apparatus for making, detecting, analyzing, or treating nanostructure; and specified particular uses of nanostructure. the term "nanostructure" is defined to mean an atomic, molecular, or macromolecular structure that: has at least one physical dimension of approximately 1-100 nanometers; and possesses a special property, provides a special function, or produces a special effect that is uniquely attributable to the structure s nanoscale physical size.

Subclass 850: Scanning probe control process

European Patent Classes & Classifications Covered in this Patent:

Class G01J3: Physics - Measuring

Measurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infra-red, visible or ultra-violet light; colorimetry; radiation pyrometry. Spectrometry; spectrophotometry; monochromators; measuring colour.

Class G01N21: Physics - Measuring

Investigating or analysing materials by determining their chemical or physical properties. Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light.

Class G12B21: Physics - Instrument Details

Details of instruments, or comparable details of other apparatus, not otherwise provided for. Details of apparatus using scanning-probe techniques note.

Class Y01N8: General Tagging Of New Technological Developments - Broad Technical Fields Characterised By Dimensional Aspects

Nanotechnology. Nanotechnlogy for interacting, sensing or actuating.