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Optics : Photonics

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Patents & Technology Available

Number of Technology Available listing in this topic: 168

Method for Detecting Defects
The technology provides a method for inspecting a substrate for defects.  > view
Straight line defect detection tool
The technology has particular applicability for in-line inspection of reticles with submicron design features.   > view
Optical inspection of an object method and apparatus
A method and an apparatus for an optical inspection of an object, having upper and lower faces, so as to detect defects existing ...  > view
Method for detecting particles using illumination with several wavelengths
A system for the detection of very small particles on patterned or bare surfaces, particularly of semiconductor wafers.   > view
System for microscopic inspection of articles
System for detecting defects in a VLSI reticle by comparison to a reference.  > view
Optical inspection method and apparatus
An object of the technology is to provide a novel method and apparatus having advantages in the above respects for inspecting the surface ...  > view
Endpoint detection for semiconductor processes
A substrate 20 in a process chamber 42 is processed at process conditions suitable for processing a layer 30 on the substrate 20...  > view
Private Listing: Number 6532
The owner of this listing has requested that patent numbers, descriptions and other information be provided only to qualifying buyers under confidentiality agreement. ...  > view
Private Listing: Number 6451
The owner of this listing has requested that patent numbers, descriptions and other information be provided only to qualifying buyers under confidentiality agreement. ...  > view
Private Listing: Number 6370
The owner of this listing has requested that patent numbers, descriptions and other information be provided only to qualifying buyers under confidentiality agreement. ...  > view
Private Listing: Number 6333
The owner of this listing has requested that patent numbers, descriptions and other information be provided only to qualifying buyers under confidentiality agreement. ...  > view
Private Listing: Number 6272
The owner of this listing has requested that patent numbers, descriptions and other information be provided only to qualifying buyers under confidentiality agreement. ...  > view
Private Listing: Number 6207
The owner of this listing has requested that patent numbers, descriptions and other information be provided only to qualifying buyers under confidentiality agreement. ...  > view
Private Listing: Number 6185
The owner of this listing has requested that patent numbers, descriptions and other information be provided only to qualifying buyers under confidentiality agreement. ...  > view
Private Listing: Number 6113
The owner of this listing has requested that patent numbers, descriptions and other information be provided only to qualifying buyers under confidentiality agreement. ...  > view
Private Listing: Number 6106
The owner of this listing has requested that patent numbers, descriptions and other information be provided only to qualifying buyers under confidentiality agreement. ...  > view
Private Listing: Number 6065
The owner of this listing has requested that patent numbers, descriptions and other information be provided only to qualifying buyers under confidentiality agreement. ...  > view
Private Listing: Number 6007
The owner of this listing has requested that patent numbers, descriptions and other information be provided only to qualifying buyers under confidentiality agreement. ...  > view
Private Listing: Number 5904
The owner of this listing has requested that patent numbers, descriptions and other information be provided only to qualifying buyers under confidentiality agreement. ...  > view
Private Listing: Number 5852
The owner of this listing has requested that patent numbers, descriptions and other information be provided only to qualifying buyers under confidentiality agreement. ...  > view