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Optics : Photonics

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Patents & Technology Available

Number of Technology Available listing in this topic: 159

Camera and Mobile Technology
Sixteen U.S. patents and their family of international counterparts available for sale.  > view
System for Tracking and Identification of Manufacturing Defects
Patented inventions cover the identification, analysis and registration of manufacturing defects  > view
Fiber Optic Patents for Sale
Nine U.S. patents for sale  > view
Technology Used for Optical Computer Tomography
A heterodyne receptor method able to detect with high resolution information light buried in scattered light, plus the ability of visualizing optical transmission ...  > view
Nonpolluting, Noise-free Thermo-Electric Cooler Technology
Solid-state thermoelectric coolers - provide unprecedented efficiency.  > view
Polymer with Distinctive Optical Properties
A polymer compound may be used as an ultra-violet light transparent material  > view
Wet Solar Cell Technology
Efficient photoelectric transformation using a photoresponsive electrode.  > view
Micro-ElectroMechanical System (MEMS) Device Patent
Wireless & RF Switching Device Design & Manufacturing   > view
Chemical Vapor Deposition Equipment, Techniques and Controls
Technique and equipment for cold wall chemical vapor deposition with unique controls  > view
Electron Beam Direct Writing of Semiconductor Wafers
apparatus and method of direct e-beam write of semiconductor wafers   > view
High Precision Positioning Stage Control for Semiconductor Manufacturing
System and methods to provide high precision stage positioning for semiconductor manufacturing.  > view
Improved control over the dimensions of a patterned photo-resist
Control over the dimensions of a patterned photo-resist to better control the critical dimensions of fabricated devices  > view
Laser Pattern Generation and Control
Patent portfolio for generating and controlling laser patterns.  > view
Fast, Non-contact, In-situ temperature sensor 220C - 1200C
Fast, non-contact, in-situ temperature sensor in a range of 220-1200'C. A proven highly sensitive system for fast, accurate and precise temperature control.  > view
System for Process Variation Monitor
A method to extend the process monitoring capabilities of a semiconductor wafer optical inspection system...  > view
Target acquisition technique for CD measurement machine
In a process for measuring the CD of a mask pattern transferred to a semiconductor wafer...  > view
Pixel Based Machine for Patterned Wafers
A method is provided for the detection of defects on a semiconductor wafer by checking individual pixels on the wafer...  > view
Method for Detecting Defects
The technology provides a method for inspecting a substrate for defects.  > view
Straight line defect detection tool
The technology has particular applicability for in-line inspection of reticles with submicron design features.   > view
Optical inspection of an object method and apparatus
A method and an apparatus for an optical inspection of an object, having upper and lower faces, so as to detect defects existing ...  > view