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Optics : Coherent

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Patents & Technology Available

Number of Technology Available listing in this topic: 180

Fast, Non-contact, In-situ temperature sensor 220C - 1200C
Fast, non-contact, in-situ temperature sensor in a range of 220-1200'C. A proven highly sensitive system for fast, accurate and precise temperature control.  > view
System for Process Variation Monitor
A method to extend the process monitoring capabilities of a semiconductor wafer optical inspection system...  > view
Method and Apparatus for Inspection of Patterned Semiconductor Wafers
A method and apparatus for inspecting a wafer surface to detect the presence of exposed conductive material...  > view
Pixel Based Machine for Patterned Wafers
A method is provided for the detection of defects on a semiconductor wafer by checking individual pixels on the wafer...  > view
Optical inspection of an object method and apparatus
A method and an apparatus for an optical inspection of an object, having upper and lower faces, so as to detect defects existing ...  > view
Method for detecting particles using illumination with several wavelengths
A system for the detection of very small particles on patterned or bare surfaces, particularly of semiconductor wafers.   > view
Method for reticle inspection using aerial imaging
A techniques for inspecting reticles that are used in fabricating microelectronic devices through a microphotolithographic process.  > view
System for microscopic inspection of articles
System for detecting defects in a VLSI reticle by comparison to a reference.  > view
Optical inspection method and apparatus
An object of the technology is to provide a novel method and apparatus having advantages in the above respects for inspecting the surface ...  > view
Optical Diffraction Microscope - ODM
Easier, faster and more reliable quality control of microstructures.  > view
Private Listing: Number 7100
The owner of this listing has requested that patent numbers, descriptions and other information be provided only to qualifying buyers under confidentiality agreement. ...  > view
Private Listing: Number 6985
The owner of this listing has requested that patent numbers, descriptions and other information be provided only to qualifying buyers under confidentiality agreement. ...  > view
Private Listing: Number 6510
The owner of this listing has requested that patent numbers, descriptions and other information be provided only to qualifying buyers under confidentiality agreement. ...  > view
Private Listing: Number 6472
The owner of this listing has requested that patent numbers, descriptions and other information be provided only to qualifying buyers under confidentiality agreement. ...  > view
Private Listing: Number 6451
The owner of this listing has requested that patent numbers, descriptions and other information be provided only to qualifying buyers under confidentiality agreement. ...  > view
Private Listing: Number 6366
The owner of this listing has requested that patent numbers, descriptions and other information be provided only to qualifying buyers under confidentiality agreement. ...  > view
Private Listing: Number 6361
The owner of this listing has requested that patent numbers, descriptions and other information be provided only to qualifying buyers under confidentiality agreement. ...  > view
Private Listing: Number 6272
The owner of this listing has requested that patent numbers, descriptions and other information be provided only to qualifying buyers under confidentiality agreement. ...  > view
Private Listing: Number 6199
The owner of this listing has requested that patent numbers, descriptions and other information be provided only to qualifying buyers under confidentiality agreement. ...  > view
Private Listing: Number 6185
The owner of this listing has requested that patent numbers, descriptions and other information be provided only to qualifying buyers under confidentiality agreement. ...  > view