Techology Listings: Process control

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Wanted: Semiconductor Manufacturing Process Patents U.S. Patents Related to the Process of Manufacturing Semiconductor Wafers... more

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Direct and Accurate Measurement of Gas Permeability of Containers

Direct and accurate measurement of gas permeation rates of various barriers....

Advanced Electronic Manufacturing Services - Business for Sale

Two facilities operating in Silicon Valley...

Improved control over the dimensions of a patterned photo-resist

Control over the dimensions of a patterned photo-resist to better control the critical dimensions of fabricated devices...

Pattern generation method and apparatus using cached cells of hierarchical data

Pattern generation method and apparatus using cached cells of hierarchical data...

Pixel Based Machine for Patterned Wafers

A method is provided for the detection of defects on a semiconductor wafer by checking individual pixels on the wafer......

Apparatus for enhancing the throughput of a wafer processing facility

An apparatus, method and medium is provided for increasing the efficiency with which wafers are transferred among different processing chambers in a wafer processing facility. A multi-slot cooling cha...

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